2. Equipments
  3. Scanning Electron Microscope (JEOL JSM-7900F) and analysis tools
  4. JEOL JSM-7900F

JEOL JSM-7900F

SEM imaging of all types of samples (low vacuum mode for insulation) in high resolution with associated analysis tools: EDXS, EBSD, heated traction machine, cathodoluminescence.

Equipement JEOL JSM 7900F